Koupit SN74LVTH18652APM s BYCHPS
Koupit se zárukou
SN74LVTH18652APM
- Part Number:
- SN74LVTH18652APM
- Výrobce:
- Popis:
- IC TXRX/REG 18BIT 3.3V 64-LQFP
- Stav volného vedení / RoHS:
- Bez olova / V souladu RoHS
- dostupné množství:
- 18335 Pieces
- Datový list:
- SN74LVTH18652APM.pdf
Úvod
BYCHIPS je distribuční odrůda pro SN74LVTH18652APM, máme zásoby pro okamžitou přepravu a také k dispozici pro dlouhodobé zásobování. Zašlete nám svůj plán nákupu SN74LVTH18652APM e-mailem vám poskytneme nejlepší cenu podle svého plánu.
Specifikace
| Napájení: | 2.7 V ~ 3.6 V |
|---|---|
| Dodavatel zařízení Package: | 64-LQFP (10x10) |
| Série: | 74LVTH |
| Obal: | Tray |
| Paket / krabice: | 64-LQFP |
| Ostatní jména: | 296-12994-5 SN74LVTH18652APMG4 SN74LVTH18652APMG4-ND |
| Provozní teplota: | -40°C ~ 85°C |
| Počet bitů: | 18 |
| Typ montáže: | Surface Mount |
| Úroveň citlivosti na vlhkost (MSL): | 3 (168 Hours) |
| Výrobní standardní doba výroby: | 6 Weeks |
| Výrobní číslo výrobce: | SN74LVTH18652APM |
| Typ logiky: | ABT Scan Test Device With Transceivers and Registers |
| Rozšířený popis: | ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10) |
| Popis: | IC TXRX/REG 18BIT 3.3V 64-LQFP |
| Email: | [email protected] |
Související díly pro SN74LVTH18652APM
| Obraz | Part Number | Výrobci | Popis | Pohled |
|---|---|---|---|---|
|
SN74LVTH18504APMG4 | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Dotaz |
|
SN74LVTH182512DGGR | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-TSSOP | Dotaz |
|
SN74LVTH18646APMG4 | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Dotaz |
|
SN74LVTH16374GRDR | Texas Instruments | IC D-TYPE POS TRG DUAL 54BGA | Dotaz |
|
SN74LVTH18646APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Dotaz |
|
SN74LVTH18512DGGR | Texas Instruments | IC SCAN TEST UNIV TXRX 64TSSOP | Dotaz |
|
SN74LVTH18511DGGR | Texas Instruments | IC UNIV BUS TXRX 18BIT 48TSSOP | Dotaz |
|
SN74LVTH182502APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Dotaz |
|
SN74LVTH18502APMR | Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | Dotaz |
|
SN74LVTH18504APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Dotaz |
|
SN74LVTH18502APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Dotaz |
|
SN74LVTH18504APMR | Texas Instruments | IC 20BIT SCAN TST DEV UBT 64LQFP | Dotaz |
|
SN74LVTH182646APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Dotaz |
|
SN74LVTH18502APMG4 | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Dotaz |
|
SN74LVTH182652APM | Texas Instruments | IC SCAN TEST DEVICE ABT 64-LQFP | Dotaz |
|
SN74LVTH18514DGGR | Texas Instruments | IC SCAN TEST UNIV TXRX 64TSSOP | Dotaz |
|
SN74LVTH182502APMR | Texas Instruments | IC SCAN-TEST-DEV/TRANSCVR 64LQFP | Dotaz |
|
SN74LVTH182504APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Dotaz |
Latest News
- Xilinx Ships Industry's First 16nm All Programmable MPSoC Ahead of Schedule
- Xilinx and Samsung Jointly Enable the World's First 5G NR Commercial Deployment
- TI's Peter Balyta to head Education Technology division; Melendy Lovett to retire
- Janet Clark to join TI board of directors
- TI unveils DLP® 0.66-inch 4K ultra-high definition (UHD) chip, enabling more affordable large screen projection displays for home, business and education
- GCHQ Director calls for international cyber pact
- Embedded World: Arm introduces fourth security element to PSA
- Last chance: Nominate BrightSparks before 28 February
- Embedded World 2019: Get the full Electronics Weekly Guide
- "Xcell Journal" Special Edition: Xilinx Customers Shape a Brilliant Future
- Xilinx Launches Public Access of the SDSoC Development Environment to Expand Zynq SoC User Base to Broad Community of Systems and Software Engineers
- Texas Instruments names Haviv Ilan senior vice president of High Performance Analog