Koupit SN74BCT8374ANT s BYCHPS
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SN74BCT8374ANT
- Part Number:
- SN74BCT8374ANT
- Výrobce:
- Popis:
- IC SCAN TEST DEVICE W/FF 24-DIP
- Stav volného vedení / RoHS:
- Bez olova / V souladu RoHS
- dostupné množství:
- 15759 Pieces
- Datový list:
- SN74BCT8374ANT.pdf
Úvod
BYCHIPS je distribuční odrůda pro SN74BCT8374ANT, máme zásoby pro okamžitou přepravu a také k dispozici pro dlouhodobé zásobování. Zašlete nám svůj plán nákupu SN74BCT8374ANT e-mailem vám poskytneme nejlepší cenu podle svého plánu.
Specifikace
| Napájení: | 4.5 V ~ 5.5 V |
|---|---|
| Dodavatel zařízení Package: | 24-PDIP |
| Série: | 74BCT |
| Obal: | Tube |
| Paket / krabice: | 24-DIP (0.300", 7.62mm) |
| Provozní teplota: | 0°C ~ 70°C |
| Počet bitů: | 8 |
| Typ montáže: | Through Hole |
| Úroveň citlivosti na vlhkost (MSL): | 1 (Unlimited) |
| Výrobní číslo výrobce: | SN74BCT8374ANT |
| Typ logiky: | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Rozšířený popis: | Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-PDIP |
| Popis: | IC SCAN TEST DEVICE W/FF 24-DIP |
| Email: | [email protected] |
Související díly pro SN74BCT8374ANT
| Obraz | Part Number | Výrobci | Popis | Pohled |
|---|---|---|---|---|
|
SN74BCT8374ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Dotaz |
|
SN74BCT8374ADWR | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Dotaz |
|
SN74BCT8374ANTG4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | Dotaz |
|
SN74BCT8373ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Dotaz |
|
SN74BCT8373ADWR | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Dotaz |
|
SN74BCT8373ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Dotaz |
|
SN74BCT8373ANT | Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | Dotaz |
|
SN74BCT8374ADW | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Dotaz |
|
SN74BCT8374ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Dotaz |
|
SN74BCT8373ADW | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Dotaz |
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