Koupit SN74LVTH182512DGGR s BYCHPS
Koupit se zárukou
SN74LVTH182512DGGR
- Part Number:
- SN74LVTH182512DGGR
- Výrobce:
- Popis:
- IC SCAN-TEST-DEV/XCVR 64-TSSOP
- Stav volného vedení / RoHS:
- Bez olova / V souladu RoHS
- dostupné množství:
- 18142 Pieces
- Datový list:
- SN74LVTH182512DGGR.pdf
Úvod
BYCHIPS je distribuční odrůda pro SN74LVTH182512DGGR, máme zásoby pro okamžitou přepravu a také k dispozici pro dlouhodobé zásobování. Zašlete nám svůj plán nákupu SN74LVTH182512DGGR e-mailem vám poskytneme nejlepší cenu podle svého plánu.
Specifikace
| Napájení: | 2.7 V ~ 3.6 V |
|---|---|
| Dodavatel zařízení Package: | 64-TSSOP |
| Série: | 74LVTH |
| Obal: | Tape & Reel (TR) |
| Paket / krabice: | 64-TFSOP (0.240", 6.10mm Width) |
| Ostatní jména: | 296-8698-2 74LVTH182512DGGRE4 74LVTH182512DGGRE4-ND 74LVTH182512DGGRG4 74LVTH182512DGGRG4-ND |
| Provozní teplota: | -40°C ~ 85°C |
| Počet bitů: | 18 |
| Typ montáže: | Surface Mount |
| Úroveň citlivosti na vlhkost (MSL): | 1 (Unlimited) |
| Výrobní standardní doba výroby: | 6 Weeks |
| Výrobní číslo výrobce: | SN74LVTH182512DGGR |
| Typ logiky: | ABT Scan Test Device With Universal Bus Transceivers |
| Rozšířený popis: | ABT Scan Test Device With Universal Bus Transceivers IC 64-TSSOP |
| Popis: | IC SCAN-TEST-DEV/XCVR 64-TSSOP |
| Email: | [email protected] |
Související díly pro SN74LVTH182512DGGR
| Obraz | Part Number | Výrobci | Popis | Pohled |
|---|---|---|---|---|
|
SN74LVTH182504APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Dotaz |
|
SN74LVTH18512DGGR | Texas Instruments | IC SCAN TEST UNIV TXRX 64TSSOP | Dotaz |
|
SN74LVTH182646APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Dotaz |
|
SN74LVTH18504APMG4 | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Dotaz |
|
SN74LVTH182502APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Dotaz |
|
SN74LVTH18652APM | Texas Instruments | IC TXRX/REG 18BIT 3.3V 64-LQFP | Dotaz |
|
SN74LVTH18511DGGR | Texas Instruments | IC UNIV BUS TXRX 18BIT 48TSSOP | Dotaz |
|
SN74LVTH18504APMR | Texas Instruments | IC 20BIT SCAN TST DEV UBT 64LQFP | Dotaz |
|
SN74LVTH182652APM | Texas Instruments | IC SCAN TEST DEVICE ABT 64-LQFP | Dotaz |
|
SN74LVTH18646APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Dotaz |
|
SN74LVTH18514DGGR | Texas Instruments | IC SCAN TEST UNIV TXRX 64TSSOP | Dotaz |
|
SN74LVTH182502APMR | Texas Instruments | IC SCAN-TEST-DEV/TRANSCVR 64LQFP | Dotaz |
|
SN74LVTH18502APMR | Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | Dotaz |
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