Koupit SN74BCT8240ADW s BYCHPS
Koupit se zárukou
SN74BCT8240ADW
- Part Number:
- SN74BCT8240ADW
- Výrobce:
- Popis:
- IC SCAN TEST DEVICE BUFF 24-SOIC
- Stav volného vedení / RoHS:
- Bez olova / V souladu RoHS
- dostupné množství:
- 17164 Pieces
- Datový list:
- SN74BCT8240ADW.pdf
Úvod
BYCHIPS je distribuční odrůda pro SN74BCT8240ADW, máme zásoby pro okamžitou přepravu a také k dispozici pro dlouhodobé zásobování. Zašlete nám svůj plán nákupu SN74BCT8240ADW e-mailem vám poskytneme nejlepší cenu podle svého plánu.
Specifikace
| Napájení: | 4.5 V ~ 5.5 V |
|---|---|
| Dodavatel zařízení Package: | 24-SOIC |
| Série: | 74BCT |
| Obal: | Tube |
| Paket / krabice: | 24-SOIC (0.295", 7.50mm Width) |
| Ostatní jména: | 296-33846-5 SN74BCT8240ADW-ND SN74BCT8240ADWE4 SN74BCT8240ADWE4-ND SN74BCT8240ADWG4 SN74BCT8240ADWG4-ND |
| Provozní teplota: | 0°C ~ 70°C |
| Počet bitů: | 8 |
| Typ montáže: | Surface Mount |
| Úroveň citlivosti na vlhkost (MSL): | 1 (Unlimited) |
| Výrobní standardní doba výroby: | 6 Weeks |
| Výrobní číslo výrobce: | SN74BCT8240ADW |
| Typ logiky: | Scan Test Device with Inverting Buffers |
| Rozšířený popis: | Scan Test Device with Inverting Buffers IC 24-SOIC |
| Popis: | IC SCAN TEST DEVICE BUFF 24-SOIC |
| Email: | [email protected] |
Související díly pro SN74BCT8240ADW
| Obraz | Part Number | Výrobci | Popis | Pohled |
|---|---|---|---|---|
|
SN74BCT8244ADWR | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Dotaz |
|
SN74BCT8244ADW | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Dotaz |
|
SN74BCT8240ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Dotaz |
|
SN74BCT8240ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Dotaz |
|
SN74BCT8245ADWR | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | Dotaz |
|
SN74BCT8244ANTG4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Dotaz |
|
SN74BCT8245ANT | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | Dotaz |
|
SN74BCT8240ANTG4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Dotaz |
|
SN74BCT8240ADWR | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Dotaz |
|
SN74BCT8245ADW | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | Dotaz |
|
SN74BCT8240ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Dotaz |
|
SN74BCT8244ADWE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Dotaz |
|
SN74BCT8244ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Dotaz |
|
SN74BCT8245ANTG4 | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | Dotaz |
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