Koupit SN74ABT18640DGGR s BYCHPS
Koupit se zárukou
SN74ABT18640DGGR
- Part Number:
- SN74ABT18640DGGR
- Výrobce:
- Popis:
- IC SCAN-TEST-DEV/TXRX 56-TSSOP
- Stav volného vedení / RoHS:
- Bez olova / V souladu RoHS
- dostupné množství:
- 17579 Pieces
- Datový list:
- SN74ABT18640DGGR.pdf
Úvod
BYCHIPS je distribuční odrůda pro SN74ABT18640DGGR, máme zásoby pro okamžitou přepravu a také k dispozici pro dlouhodobé zásobování. Zašlete nám svůj plán nákupu SN74ABT18640DGGR e-mailem vám poskytneme nejlepší cenu podle svého plánu.
Specifikace
| Napájení: | 4.5 V ~ 5.5 V |
|---|---|
| Dodavatel zařízení Package: | 56-TSSOP |
| Série: | 74ABT |
| Obal: | Tape & Reel (TR) |
| Paket / krabice: | 56-TFSOP (0.240", 6.10mm Width) |
| Ostatní jména: | 296-3941-2 |
| Provozní teplota: | -40°C ~ 85°C |
| Počet bitů: | 18 |
| Typ montáže: | Surface Mount |
| Úroveň citlivosti na vlhkost (MSL): | 1 (Unlimited) |
| Výrobní číslo výrobce: | SN74ABT18640DGGR |
| Typ logiky: | Scan Test Device with Inverting Bus Transceivers |
| Rozšířený popis: | Scan Test Device with Inverting Bus Transceivers IC 56-TSSOP |
| Popis: | IC SCAN-TEST-DEV/TXRX 56-TSSOP |
| Email: | [email protected] |
Související díly pro SN74ABT18640DGGR
| Obraz | Part Number | Výrobci | Popis | Pohled |
|---|---|---|---|---|
|
SN74ABT18640DLRG4 | Texas Instruments | IC SCAN TEST DEVICE 18BIT 56SSOP | Dotaz |
|
SN74ABT18504PMR | Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | Dotaz |
|
SN74ABT18646PM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | Dotaz |
|
SN74ABT18504PMRG4 | Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | Dotaz |
|
SN74ABT18640DLR | Texas Instruments | IC SCAN TEST DEVICE 18BIT 56SSOP | Dotaz |
|
SN74ABT18504PMG4 | Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | Dotaz |
|
SN74ABT18652PM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | Dotaz |
|
SN74ABT18245ADL | Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-SSOP | Dotaz |
|
SN74ABT18640DL | Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-SSOP | Dotaz |
|
SN74ABT18245ADGGR | Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | Dotaz |
Latest News
- Xilinx Ships Industry's First 16nm All Programmable MPSoC Ahead of Schedule
- Xilinx and Samsung Jointly Enable the World's First 5G NR Commercial Deployment
- TI to reduce costs in Wireless business; OMAP™ processors and wireless connectivity solutions will focus on embedded markets
- TI's Peter Balyta to head Education Technology division; Melendy Lovett to retire
- Janet Clark to join TI board of directors
- TI unveils DLP® 0.66-inch 4K ultra-high definition (UHD) chip, enabling more affordable large screen projection displays for home, business and education
- GCHQ Director calls for international cyber pact
- Embedded World: Arm introduces fourth security element to PSA
- Last chance: Nominate BrightSparks before 28 February
- Embedded World 2019: Get the full Electronics Weekly Guide
- "Xcell Journal" Special Edition: Xilinx Customers Shape a Brilliant Future
- Xilinx Launches Public Access of the SDSoC Development Environment to Expand Zynq SoC User Base to Broad Community of Systems and Software Engineers